Description: | SWS instrument was taken offline for an annual calibration.
Comparision of the December 19, 2007 annual calibration with the previous annual
calibration done on November 8, 2006 shows very little change in the instrument sensitivity over
2007. From our analysis, there is effectively no change in the silicon spectrometer
sensitivity from 400 to 981 nanometers. The InGaAs spectrometer shows a slight decrease in
sensitivity of 1 to 2% over the wavelength range of 982 to 2150 nanometers, which is within
our expected error range. Characterization of the change in sensitivity from 350 to 400
nanometers over the year is a bit more difficult to determine and maybe greater than our
expected error of 2%. The science team at the University of Colorado is currently
working on this problem. |